| 000 | 13079aam a2201525 4500 | ||
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| 001 | NM002448 | ||
| 003 | AR-HaUTN | ||
| 005 | 20240917164212.0 | ||
| 007 | ta | ||
| 008 | 61120sc. 1 ||||||||||||||000 | spa|| | ||
| 020 | _a0849383471 | ||
| 040 |
_aAR-HaUTN _cAR-HaUTN |
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| 080 | _a531.7:6=111 MEA | ||
| 245 |
_aThe measurement, instrumentation, and sensors handbook / _ceditor in chief John G. Webster. |
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| 260 |
_aBoca Ratón : _bCRC , _cc. 1999. |
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| 300 | _apaginación por capítulos | ||
| 490 | _aThe Electrical Engineering Handbook Series | ||
| 500 | _aColección de artículos temáticos. | ||
| 500 | _aLa obra está organizada en catorce partes: I) Measurement characteristics; II) Spatial variables measurement; III) Time and frequency measurement; IV) Mechanical variables measurement-Solid; V) Mechanical variables measurement-Fluid; VI) Mechanical variables measurement-Thermal; VII) Electromagnetic variables measurement; VIII) Optical variables measurement; IX) Radiation measurement; X) Chemical variables measurement; XI) Biomedical variables measurement; XII) Signal processing; XIII) Displays; XIV) Control. | ||
| 500 | _aÍndice alfabético en páginas posliminares. | ||
| 505 |
_tCharacteristics of instrumentation / _aR. John Hansman, Jr. |
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| 505 |
_tOperational modes of instrumentation / _aRichar S. Figliola. |
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| 505 |
_tStatic and dynamic characteristics of instrumentation / _aPeter H. Sydenham. |
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| 505 |
_tMeasurement accuracy / _aRonald H. Dieck. |
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| 505 |
_tMeasurement standards / _aDeWayne B. Sharp. |
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| 505 |
_tDisplacement measurement, linear and angular : _aResistive displacement sensors / Keith Antonelli, James Ko, and Shyan Ku. -- Inductive displacement sensors / Halit Eren. -- Capacitive sensors-displacement / Halit Eren and Wei Ling Kong. -- Piezoelectric transducers and sensors / Ahmad Safari, Victor F. Janas ; Amit Bandyopadhayay, and Andrei Kholkine. -- Laser interferometer displacement sensors / Bernhard Günther Zagar. -- Bore gaging displacement sensors / Viktor P. Astakhov. -- Time-of-flight ultrasonic displacement sensors / Teklic Ole Pedersen and Nils Karlsonn. -- Optical encoder displacement sensors / J. R. René Mayer. -- Magnetic displacement sensors / David S. Nyce. -- Synchro/Resolver displacement sensors / Robert M. Hyatt, Jr and David Dayton. -- Optical fiber displacement sensors / Richard O. Claus, Vikram Bhatia, and Anbo Wang. -- Optical beam deflection sensing / Grover C. Wetsel. |
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| 505 |
_tThickness measurement / _rJohn C. Brasunas, G. Mark Cushman, and Brokk Lakew. |
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| 505 |
_tProximity sensing for robotics / _r R. E. Saad, A. Bonen, K. C. Smith, and B. Benhabib. |
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| 505 |
_tDistance / _rW. John Ballantyne. |
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| 505 |
_tPosition, locations, altitude measurement : _aAltitude measurement / Dimitris Manolakis. -- Attitude measurement / Mark A. Stedham, Partha B. Banerjee, Seiji Nishfuji, and Shogo Tanaka. -- Inertial navigation / Halit Eren and C. C. Fung. --Satellite navigation and radiolocation / Halit Eren and C. C. Fung. -- Occupancy detection / Jacob Fraden. |
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| 505 |
_tLevel measurement / _rDetlef Brumbi. |
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| 505 |
_tArea measurement / _rCharles B. Coulbourn and Wolfgang P. Buerner. |
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| 505 |
_tVolume measurement / _rRené G. Aarnink and Hessel Wijskstra. |
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| 505 |
_tAngle measurement / _rRobert J. Sandberg. |
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| 505 |
_tTilt measurement / _rAdam Chrzanowski and James M. Secord. |
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| 505 |
_tVelocity measurement / _rCharles P. Pinney and William E. Baker. |
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| 505 |
_tAcceleration, vibration, and shock measurement / _rHalit Eren. |
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| 505 |
_tTime measurement / _rMichael A. Lombardi. |
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| 505 |
_tFrequency measurement / _rMichael A. Lombardi. |
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| 505 |
_tMass and weight measurement / _rMark Fritz and Emil Hazarian. |
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| 505 |
_tDensity measurement / _rHalit Eren. |
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| 505 |
_tStrain measurement / _rChristopher S. Lynch. |
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| 505 |
_tForce measurement / _rChristopher S. Lynch. |
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| 505 |
_tToruqe and power measurement / _rIvan J. Garshelis. |
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| 505 |
_tTactile sensing / _rR. E. Saad, A. Bonen, K. C. Smith, and B. Benhabib. |
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| 505 |
_tPreassure and sound measurement : _aPressure measurement / Kevin H. -L. Chou. --Vacuum measurement / Ron Goehner, Emil Dubretsky, Howard M. Brady, and William H. Bayles, Jr. -- Ultrasound measurement / Peder C. Pedersen. |
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| 505 |
_tAcoustic measurement / _rPer Rasmussen. |
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| 505 |
_tFlow measurement : _aDifferential preassure flowmeters / Richard Thorn. -- Variable area flowmeters / Adrian Melling, Herbert Köchner, and Reinhard Haak. -- Positive displacement flowmeters / Zaki D. Husain and Donald J. Wass. -- Turbine and vane flowmeters / David Wadlow. -- Impeller flowmeters / Harold M. Miller. -- Electromagnetic flowmeters / Halit Eren. -- Ultrasonic flowmeters / Hans-Peter Vaterlaus, Thomas Hossle, Paolo Giordano, and Christophe Bruttin. -- Vortex shedding flowmeters / Wade M. Mattar and James H. Vignos. -- Thermal mass flow sensors / Nam-Trung Nguyen. -- Coriolis effect mass flowmeters / Jesse Yoder. -- Drag force flowmeters / Rekha Philip-Chandy, Roger Morgan, Patricia J. Scully. |
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| 505 |
_tPoint velocity measurement : _aPitot probe anemometry / John A. Kleppe. -- Thermal anemometry / John G. Olin. -- Laser anemometry / Rajan K. Menon. |
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| 505 |
_tViscosity measurement / _rG. E. Leblanc, R. A. Secco, M. Kostic. |
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| 505 |
_tSurface tension measurement / _rDavid B. Thiessen, Kin F. Man. |
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| 505 |
_tTemperature measurement : _aBimaterials thermometers / Robert J. Stephenson, Armelle M. Moulin, and Mark E. Welland. -- Resistive thermometers / Jim Burns. -- Thermistor thermometers / Meyer Sapoff. --Thermocouple thermometers / R. P. Reed. -- Semiconductor junction thermometers / Randy Frank. -- Infrared thermometers / Jacob Fraden. -- Liquid-in-glass thermometers / J. V. Nicholas. -- Manometric thermometers / Franco Pavese. -- Temperature indicators / Jan Stasiek, Tolestyn Madaj, Jaroslaw MIkielewicz. -- Fiber-optic thermometers / Brian Culshaw. |
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| 505 |
_tThermal conductivity measurement / _rWilliam A. Wakeham and Marc J. Assael. |
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| 505 |
_tHeat flux / _rThomas E. Diller. |
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| 505 |
_tThermal imaging / _rHerbert M. Runciman. |
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| 505 |
_tCalorimetry measurement / _rSander van Herwaarden. |
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| 505 |
_tVoltage measurement : _aMeter voltage measurement / Alessandro Ferrero. -- Oscilloscope voltage measurement / Jerry Murphy. -- Inductive capacitive voltage measurement / Cipriano Bartoletti, Luca Podestà, and Giancarlo Sacerdoti. |
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| 505 |
_tCurrent measurement / _rDouglas P. McNutt. |
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| 505 |
_tPower measurement / _rPasquale Arpaia, Francesco Avallone, Aldo Baccigalupi, Claudio De Capua, Carmine Landi. |
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| 505 |
_tPower factor measurement / _rMichael Z. Lowenstein. |
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| 505 |
_tPhase measurement / _rPeter O'Shea. |
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| 505 |
_tEnergy measurement / _rArnaldo Brandolini and Alessandro Gandelli. |
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| 505 |
_tElectrical conductivity and resistivity / _rMichael B. Heaney. |
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| 505 |
_tCharge measurement / _rSaps Buchman, John Mester, and T. J. Sumner. |
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| 505 |
_tCapacitance and capacitance measurements / _rHalit Eren and James Goh. |
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| 505 |
_tPermittivity measurement / _rDevendra K. Misra. |
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| 505 |
_tElectric field strength / _rDavid A. Hill and Motohisa Kanda. |
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| 505 |
_tMagnetic field measurement / _rSteven A. Macintyre. |
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| 505 |
_tPermeability and hysteresis measurement / _rJeff P. Anderson and Richard J. Blotzer. |
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| 505 |
_tInductance measurement / _rMichał Szyper. |
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| 505 |
_tImmittance measurement / _rAchim Dreher. |
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| 505 |
_tQ Factor measurement / _rAlbert D. Helfrick. |
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| 505 |
_tDistortion measurement / _rMichael F. Toner and Gordon W. Roberts. |
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| 505 |
_tNoise measurement / _rW. Marshall Leach, Jr. |
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| 505 |
_tMicrowave measurement / _rA. Dehé, K. Beilenhoff, K. Fricke, H. Klingbeil, V. Krozer, H. L. Hartnagel. |
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| 505 |
_tPhotometry and radiometry : _aPhotoductive sensors / Fritz Schuermeyer and Thad Pickenpaugh. -- Photojunction sensors / Michael R. Squillante and Kanai S. Shah. -- Charge-coupled devices / J. A. Nousek, M. W. Bautz, B. E. Burke, J. A. Gregory, R. E. Griffiths, R. L. Kraft, H. L. Kwok, D. h. Lumb. |
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| 505 |
_tDensitometry measurement / _rJoseph H. Altman. |
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| 505 |
_tColorimetry / _rRobert T. Marcus. |
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| 505 |
_tOptical loss / _rHalit Eren. |
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| 505 |
_tPolarization measurement / _rSoe-Mie F. Nee. |
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| 505 |
_tRefractive index measurement / _rG. H. Meeten. |
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| 505 |
_tTurbidity measurement / _rDaniel Harrison and Michael Fisch. |
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| 505 |
_tLaser output measurement / _rHaiyin Sun. |
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| 505 | _tVision and image sensors / Stanley S. Ipson and Chima Okereke. | ||
| 505 |
_tRadioactivity measurement / _rBert M. Coursey. |
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| 505 |
_tRadioactivity measurement / _rLarry A. Franks, Ralph B. James, and Larry S. Darken. |
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| 505 |
_tCharged particle measurement / _rJohn C. Armitage, Madhu S. Dixit, Jacques Dubeau, Hans Mes, and F. Gerald Oakham. |
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| 505 |
_tNeutron measurement / _rSteven M. Grimes. |
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| 505 |
_tDosimetry measurement / _rBrian L. Justus, Mark A. Miller, and Alan L. Huston. |
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| 505 |
_tComposition measurement : _aElectrochemical composition measurement / Michael J. Schöning, Olaf Glück, and Marion Thust. -- Thermal composition measurement / Mushtaq Ali, Behrooz Pahlavanpour, and Maria Eklund. -- Kinetic methods / E. E. Uzgiris and J. Y. Gui. -- Chromatography composition measurement / Behrooz Pahlavanpour, Musthaq Ali, and C. K. Laird. |
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| 505 |
_tpH Measurement / _rNorman F. Sheppard, Jr. and Anthony Guiseppi-Elie. |
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| 505 |
_tHumidity and moisture measurement / _rGert J. w. Vischer. |
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| 505 |
_tEnvironmental measurement : _aMeteorological measurement / John D. Garrison and Stephen B. W. Roeder. -- Air pollution measurement / Michael Bennett. -- Water quality measurement / Kathleen M. Leonard. -- Satellite imaging and sensing / Jacqueline Le Moigne and Robert F. Cromp. |
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| 505 |
_tBiopotentials and electrophysiology measurement / _rNitish V. Takor. |
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| 505 |
_tBlood pressure measurement / _rShyam Rithalia, Mark Sun, and Roger Jones. |
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| 505 |
_tBlood flow measurements / _rPer Ask and Åke Öberg. |
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| 505 |
_tVentilation measurement / _rL. Basano and P. Ottonello. |
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| 505 |
_tBlood chemistry measurement / _rTerry L. Rusch and Ravi Sankar. |
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| 505 |
_tMedical imaging / _rJames T. Dobbins III, Sean M. Hames, Bruce H. Hasegawa, Timothy R. DeGrado, James A. Zagzebski, and Richar Frayne. |
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| 505 |
_tAmplifiers and signal conditioners / _rRamón Pallás-Areny. |
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| 505 |
_tModulation / _rDavid M. Beams. |
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| 505 |
_tFilters / _rRahman Jamal and Robert Steer. |
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| 505 |
_tSpectrum analysis and correlation : _aFFT spectrum analysis and correlation / Ronney B. Panerai. -- RF/Microwawe spectrum analysis / A. Ambrosini, C. Bortolotti, N. D'Amico, G. Grueff, S. Marioti, S. Montebugnoli; A. Orfei, and G. Tomassetti. |
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| 505 |
_tApplied intelligence processing / _rPeter H. Sydenham and Rodney Pratt. |
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| 505 |
_tAnalog-to-digital converters / _rE. B. Loewenstein. |
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| 505 |
_tComputers / _rA. M. MacLeod, P. F. Martin, and W. A. Gillespie. |
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| 505 |
_tTelemetry / _rAlbert Lozano-Nieto. |
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| 505 |
_tSensor networks and communication / _rRobert M. Crovella. |
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| 505 |
_tElectromagnetic compatibility : _aGrounding and shielding in industrial electronic systems / Daryl Gerke and William Kimmel. -- EMI and EMC test methods / Jeffrey P. Mills. |
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| 505 |
_tHuman factors in displays / _rSteven A. Murray y Barrett S. Caldwell. |
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| 505 |
_tCathode ray tube displays / _rChristopher J. sherman. |
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| 505 |
_tLiquid crystal displays / _rKalluri R. Sarma. |
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| 505 |
_tPlasma-driven flat panel displays / _r Robert T. McGrath, Ramanapathy Veerasingam, William C. Moffatt, and Robert B. Campbell. |
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| 505 |
_tElectroluminescent displays / _rWilliam A. Barrow. |
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| 505 |
_tLight-emitting diode displays / _rMohammad A. Karim. |
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| 505 |
_tReading/recording devices / _rGraphic recorders / Herman Vermariën. -- Data acquisition systems / Edward McConnell. -- Magnetic and optical recorders / Yufeng Li. |
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| 505 |
_tPID Control / _r F. Greg Shinskey. |
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| 505 |
_tOptimal control / _rHalit Eren. |
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| 505 |
_tElectropneumatic and electrohydraulic instruments : modeling of electrohydraulic and electrohydrostatic actuators / _r M. Patcher and C. H. Houpis. |
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| 505 |
_tExplosion-proof instruments / _rSam S. Khalilieh. |
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| 505 |
_tMeasurement and identification of brush, brusless, and dc stepping motors / _r Stuart Schweid, Robert Lofthus, and John McInroy. |
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| 505 |
_tAppendix : units and conversions / _rB. W. Petley. |
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| 650 | 1 | 0 |
_aINSTRUMENTOS DE MEDIDA _93619 |
| 650 | 2 | 7 |
_aMEDIDA _2Tesauro SPINES _93620 |
| 653 | _aIngeniería Aeronaútica | ||
| 653 | _aInstrumentos y Mediciones | ||
| 700 |
_aWebster, John G. _eeditor _95260 |
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| 800 |
_aDorf, Richard C. _95261 |
||
| 942 |
_cBK _2udc |
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| 999 |
_c2448 _d2448 |
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