| 000 | 00908nam a22002897a 4500 | ||
|---|---|---|---|
| 001 | NM003333 | ||
| 003 | AR-HaUTN | ||
| 007 | ta | ||
| 008 | 93120s1975 ||||||||||||||000 | spa|| | ||
| 005 | 20240930172314.0 | ||
| 020 | _a0412137704 | ||
| 040 | _aarhautn | ||
| 100 |
_aLoretto, M. H. _98105 |
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| 245 |
_aDefect analysis in electron microscopy _cM. H. Loretto , R. E. Smallman |
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| 250 | _a1st ed. | ||
| 260 |
_aLondon _bChapman and Hall |
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| 300 |
_a134 p. _bil. byn |
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| 500 | _aApéndices e índice alfabético, al final del libro | ||
| 504 | _aReferencias bibliográficas p. 131 | ||
| 505 | _tBasic electron microscope operation | ||
| 505 | _tThe formation and analysis of diffraction patterns | ||
| 505 | _tAn introduction to image contrast | ||
| 505 | _tAnalysis of crystal defects | ||
| 505 | _tFurther techniques of defect analysis | ||
| 700 |
_aSmallman, R. E. _98106 |
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| 942 | _cBK | ||
| 999 |
_c3333 _d3333 |
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